TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_04_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-005-03 | FUSED_ID : 6359364768389689427
  IC_TEMP :  -52.21 | VDDM : 1126.52 | AUX_INT :   -7.40 | CsaBias :   68.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04384e-03 / 2
  ADC_P0  : -7.39830e-03 ± 2.18827e-02
  ADC_P1  : 8.47289e-03 ± 5.47683e-04
  ADC_P2  : -5.78981e-06 ± 2.71299e-06
  CSA_Chi2/NDF : 1.74537e-04 / 2
  CSA_P0  : 6.00832e-02 ± 8.81182e-03
  CSA_P1  : 1.02064e-02 ± 6.63907e-04
  CSA_P2  : -5.06724e-05 ± 1.01105e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [24, 25, 39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [18, 51, 67, 85, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2097', '1.800', '0.1653', '1.799', '0.0940', '7.000', '0.7071', 1, 1, 1, 1, 1724922258.1437871]
VI_after__Init : ['1.202', '0.2097', '1.800', '0.1652', '1.800', '0.0882', '7.000', '0.7072', 1, 1, 1, 1, 1724922266.2551854]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1410', '1.803', '0.1122', '7.000', '0.7079', 1, 1, 1, 1, 1724922334.243231]