TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_01_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-007-03 | FUSED_ID : 6359364768389689459
  IC_TEMP :  -58.43 | VDDM : 1122.46 | AUX_INT :   -9.03 | CsaBias :   73.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42009e-03 / 2
  ADC_P0  : -9.02575e-03 ± 2.55786e-02
  ADC_P1  : 8.25580e-03 ± 6.25866e-04
  ADC_P2  : -5.04972e-06 ± 3.05307e-06
  CSA_Chi2/NDF : 1.63934e-04 / 2
  CSA_P0  : 5.88591e-02 ± 8.53998e-03
  CSA_P1  : 9.89858e-03 ± 6.43426e-04
  CSA_P2  : -4.95789e-05 ± 9.79862e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [29, 84, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [23, 59, 63, 67, 93, 101, 105, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2845', '1.800', '0.1514', '1.800', '0.0835', '7.000', '0.7076', 1, 1, 1, 1, 1724922066.3042598]
VI_after__Init : ['1.202', '0.2847', '1.800', '0.1513', '1.800', '0.0785', '7.000', '0.7073', 1, 1, 1, 1, 1724922074.2666388]
VI_at__the_End : ['1.201', '0.4831', '1.800', '0.1389', '1.800', '0.1139', '7.000', '0.7081', 1, 1, 1, 1, 1724922140.9595253]