TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_59_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-008-03 | FUSED_ID : 6359364768389689475
  IC_TEMP :  -50.96 | VDDM : 1130.74 | AUX_INT :   -9.59 | CsaBias :   81.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53383e-03 / 2
  ADC_P0  : -9.58931e-03 ± 2.65556e-02
  ADC_P1  : 8.32408e-03 ± 6.44193e-04
  ADC_P2  : -5.69245e-06 ± 3.11040e-06
  CSA_Chi2/NDF : 1.10580e-04 / 2
  CSA_P0  : 5.93147e-02 ± 7.01391e-03
  CSA_P1  : 9.83245e-03 ± 5.28448e-04
  CSA_P2  : -4.54432e-05 ± 8.04763e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [7, 12, 47, 69, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [6, 9, 39, 74, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4739', '1.800', '0.1706', '1.800', '0.0953', '7.000', '0.7075', 1, 1, 1, 1, 1724921970.2327182]
VI_after__Init : ['1.201', '0.4742', '1.800', '0.1708', '1.800', '0.0892', '7.000', '0.7072', 1, 1, 1, 1, 1724921978.9529815]
VI_at__the_End : ['1.201', '0.4940', '1.800', '0.1368', '1.799', '0.1118', '7.000', '0.7084', 1, 1, 1, 1, 1724922038.757394]