TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_56_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-010-03 | FUSED_ID : 6359364768389689507
  IC_TEMP :  -56.77 | VDDM : 1108.51 | AUX_INT :   -8.12 | CsaBias :   76.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08484e-03 / 2
  ADC_P0  : -8.11991e-03 ± 2.22982e-02
  ADC_P1  : 8.50749e-03 ± 5.56854e-04
  ADC_P2  : -5.88597e-06 ± 2.76104e-06
  CSA_Chi2/NDF : 1.68639e-04 / 2
  CSA_P0  : 6.02645e-02 ± 8.66166e-03
  CSA_P1  : 1.04079e-02 ± 6.52594e-04
  CSA_P2  : -5.40419e-05 ± 9.93823e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [11, 22, 52, 53, 55, 60, 78, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [32, 34, 43, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2987', '1.800', '0.1531', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1724921778.1694124]
VI_after__Init : ['1.202', '0.2984', '1.800', '0.1530', '1.801', '0.0849', '7.000', '0.7079', 1, 1, 1, 1, 1724921786.9016912]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1412', '1.801', '0.1134', '7.000', '0.7084', 1, 1, 1, 1, 1724921855.399488]