TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_53_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-012-03 | FUSED_ID : 6359364768389689539
  IC_TEMP :  -61.42 | VDDM : 1137.60 | AUX_INT :   -9.92 | CsaBias :   68.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39054e-03 / 2
  ADC_P0  : -9.92018e-03 ± 2.51945e-02
  ADC_P1  : 8.82341e-03 ± 6.31891e-04
  ADC_P2  : -7.22920e-06 ± 3.15237e-06
  CSA_Chi2/NDF : 1.80456e-04 / 2
  CSA_P0  : 6.00151e-02 ± 8.96000e-03
  CSA_P1  : 1.08387e-02 ± 6.75071e-04
  CSA_P2  : -6.04971e-05 ± 1.02805e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 37, 49, 96, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [5, 27, 47, 107, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2558', '1.800', '0.1610', '1.800', '0.0896', '7.000', '0.7079', 1, 1, 1, 1, 1724921586.373208]
VI_after__Init : ['1.201', '0.2557', '1.800', '0.1610', '1.799', '0.0842', '7.000', '0.7081', 1, 1, 1, 1, 1724921594.487567]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1377', '1.800', '0.1146', '7.000', '0.7086', 1, 1, 1, 1, 1724921654.1709285]