TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_51_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-013-03 | FUSED_ID : 6359364768389689555
  IC_TEMP :  -55.32 | VDDM : 1123.40 | AUX_INT :   -6.41 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53087e-04 / 2
  ADC_P0  : -6.41270e-03 ± 2.09342e-02
  ADC_P1  : 8.22908e-03 ± 5.18738e-04
  ADC_P2  : -4.94621e-06 ± 2.54133e-06
  CSA_Chi2/NDF : 1.56150e-04 / 2
  CSA_P0  : 5.94563e-02 ± 8.33478e-03
  CSA_P1  : 9.87098e-03 ± 6.27965e-04
  CSA_P2  : -4.86122e-05 ± 9.56317e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 39, 43, 45, 80, 126, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 62, 83, 90, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2047', '1.800', '0.1595', '1.800', '0.0887', '7.000', '0.7078', 1, 1, 1, 1, 1724921491.0345747]
VI_after__Init : ['1.201', '0.2048', '1.800', '0.1593', '1.800', '0.0829', '7.000', '0.7078', 1, 1, 1, 1, 1724921499.2118878]
VI_at__the_End : ['1.201', '0.4820', '1.800', '0.1382', '1.804', '0.1136', '7.000', '0.7086', 1, 1, 1, 1, 1724921559.4530735]