TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_48_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-015-03 | FUSED_ID : 6359364768389689587
  IC_TEMP :  -49.60 | VDDM : 1133.61 | AUX_INT :   -6.53 | CsaBias :   76.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.18012e-04 / 2
  ADC_P0  : -6.53046e-03 ± 1.93565e-02
  ADC_P1  : 8.39218e-03 ± 4.82793e-04
  ADC_P2  : -5.57330e-06 ± 2.38033e-06
  CSA_Chi2/NDF : 1.10136e-04 / 2
  CSA_P0  : 5.85541e-02 ± 6.99982e-03
  CSA_P1  : 9.90074e-03 ± 5.27386e-04
  CSA_P2  : -4.52520e-05 ± 8.03147e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [61, 88, 110, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [12, 22, 29, 62, 67, 105, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4033', '1.800', '0.1482', '1.799', '0.0988', '7.000', '0.7079', 1, 1, 1, 1, 1724921298.1503491]
VI_after__Init : ['1.201', '0.4033', '1.800', '0.1482', '1.800', '0.0935', '7.000', '0.7076', 1, 1, 1, 1, 1724921306.968676]
VI_at__the_End : ['1.201', '0.4990', '1.800', '0.1386', '1.800', '0.1103', '7.000', '0.7085', 1, 1, 1, 1, 1724921374.1834338]