TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_40_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-020-04 | FUSED_ID : 6359364768389689668
  IC_TEMP :  -49.45 | VDDM : 1130.62 | AUX_INT :   -7.31 | CsaBias :   68.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.65025e-04 / 2
  ADC_P0  : -7.31297e-03 ± 2.10470e-02
  ADC_P1  : 8.46306e-03 ± 5.28533e-04
  ADC_P2  : -5.54312e-06 ± 2.63314e-06
  CSA_Chi2/NDF : 9.63396e-05 / 2
  CSA_P0  : 6.06662e-02 ± 6.54673e-03
  CSA_P1  : 1.00833e-02 ± 4.93249e-04
  CSA_P2  : -4.82812e-05 ± 7.51160e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [49, 56, 83, 91, 106, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [38, 60, 86, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2496', '1.800', '0.1488', '1.800', '0.0875', '7.000', '0.7077', 1, 1, 1, 1, 1724920817.285272]
VI_after__Init : ['1.201', '0.2497', '1.800', '0.1487', '1.800', '0.0821', '7.000', '0.7078', 1, 1, 1, 1, 1724920825.488713]
VI_at__the_End : ['1.201', '0.4989', '1.800', '0.1392', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1724920892.8164318]