TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_37_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-022-04 | FUSED_ID : 6359364768389689700
  IC_TEMP :  -49.84 | VDDM : 1131.68 | AUX_INT :   -6.95 | CsaBias :   86.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.72418e-04 / 2
  ADC_P0  : -6.95201e-03 ± 1.99810e-02
  ADC_P1  : 8.59391e-03 ± 5.06180e-04
  ADC_P2  : -6.08413e-06 ± 2.53551e-06
  CSA_Chi2/NDF : 1.31442e-04 / 2
  CSA_P0  : 5.65882e-02 ± 7.64698e-03
  CSA_P1  : 1.03041e-02 ± 5.76145e-04
  CSA_P2  : -4.99395e-05 ± 8.77401e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [2, 16, 34, 88, 102, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 36, 107, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4641', '1.800', '0.1594', '1.799', '0.0904', '7.000', '0.7076', 1, 1, 1, 1, 1724920625.019112]
VI_after__Init : ['1.200', '0.4638', '1.800', '0.1596', '1.800', '0.0845', '7.000', '0.7074', 1, 1, 1, 1, 1724920633.2373893]
VI_at__the_End : ['1.201', '0.5035', '1.800', '0.1398', '1.800', '0.1094', '7.000', '0.7083', 1, 1, 1, 1, 1724920695.4166577]