TEST_NAME : Wafer
TEST_DATE : 24_08_29-10_35_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-007-023-04 | FUSED_ID : 6359364768389689716
  IC_TEMP :  -50.71 | VDDM : 1129.75 | AUX_INT :   -7.18 | CsaBias :   75.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.21718e-04 / 2
  ADC_P0  : -7.18218e-03 ± 1.93854e-02
  ADC_P1  : 8.28517e-03 ± 4.72575e-04
  ADC_P2  : -5.58307e-06 ± 2.28542e-06
  CSA_Chi2/NDF : 1.25003e-04 / 2
  CSA_P0  : 5.69246e-02 ± 7.45732e-03
  CSA_P1  : 9.84005e-03 ± 5.61855e-04
  CSA_P2  : -4.45506e-05 ± 8.55638e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [33, 60, 85, 96, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [14, 21, 27, 60, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2478', '1.800', '0.1547', '1.800', '0.0873', '7.000', '0.7083', 1, 1, 1, 1, 1724920529.2154074]
VI_after__Init : ['1.201', '0.2478', '1.800', '0.1547', '1.801', '0.0800', '7.000', '0.7076', 1, 1, 1, 1, 1724920537.3407238]
VI_at__the_End : ['1.201', '0.4942', '1.800', '0.1345', '1.803', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1724920603.9366343]