TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_25_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-012-07 | FUSED_ID : 6359364768389693639
  IC_TEMP :  -52.16 | VDDM : 1133.55 | AUX_INT :   -7.54 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03354e-03 / 2
  ADC_P0  : -7.54445e-03 ± 2.17669e-02
  ADC_P1  : 8.32387e-03 ± 5.33580e-04
  ADC_P2  : -5.65827e-06 ± 2.58998e-06
  CSA_Chi2/NDF : 1.40527e-04 / 2
  CSA_P0  : 5.91268e-02 ± 7.90682e-03
  CSA_P1  : 9.82186e-03 ± 5.95721e-04
  CSA_P2  : -4.70951e-05 ± 9.07213e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 6, 12, 25, 59, 109, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 6, 14, 57, 68, 75, 93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2545', '1.799', '0.1194', '1.800', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1724923503.361064]
VI_after__Init : ['1.201', '0.2545', '1.800', '0.1194', '1.800', '0.0834', '7.000', '0.7073', 1, 1, 1, 1, 1724923511.3625002]
VI_at__the_End : ['1.201', '0.4886', '1.799', '0.1398', '1.800', '0.1130', '7.000', '0.7080', 1, 1, 1, 1, 1724923572.1019034]