TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_26_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-013-07 | FUSED_ID : 6359364768389693655
  IC_TEMP :  -52.13 | VDDM : 1131.65 | AUX_INT :   -8.01 | CsaBias :   74.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06120e-03 / 2
  ADC_P0  : -8.00848e-03 ± 2.20396e-02
  ADC_P1  : 8.35808e-03 ± 5.37357e-04
  ADC_P2  : -5.94333e-06 ± 2.59623e-06
  CSA_Chi2/NDF : 8.47516e-05 / 2
  CSA_P0  : 6.01557e-02 ± 6.14039e-03
  CSA_P1  : 9.52580e-03 ± 4.62634e-04
  CSA_P2  : -4.25369e-05 ± 7.04537e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [3, 4, 10, 17, 19, 40, 44, 47, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 74, 77, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2970', '1.800', '0.1806', '1.800', '0.0920', '7.000', '0.7072', 1, 1, 1, 1, 1724923599.2098365]
VI_after__Init : ['1.201', '0.2976', '1.800', '0.1802', '1.799', '0.0866', '7.000', '0.7075', 1, 1, 1, 1, 1724923607.4152513]
VI_at__the_End : ['1.201', '0.4878', '1.800', '0.1363', '1.803', '0.1114', '7.000', '0.7080', 1, 1, 1, 1, 1724923666.815598]