TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_37_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-020-00 | FUSED_ID : 6359364768389693760
  IC_TEMP :  -47.79 | VDDM : 1131.31 | AUX_INT :  -17.45 | CsaBias :   68.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36289e-03 / 2
  ADC_P0  : -1.74454e-02 ± 2.54663e-02
  ADC_P1  : 8.61623e-03 ± 6.30524e-04
  ADC_P2  : -6.38568e-06 ± 3.09374e-06
  CSA_Chi2/NDF : 1.64016e-04 / 2
  CSA_P0  : 5.92370e-02 ± 8.54211e-03
  CSA_P1  : 1.03313e-02 ± 6.43587e-04
  CSA_P2  : -5.06374e-05 ± 9.80106e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [31, 36, 45, 89, 112, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [7, 14, 18, 24, 49, 58, 66, 92, 102, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3193', '1.800', '0.1516', '1.800', '0.0898', '7.000', '0.7077', 1, 1, 1, 1, 1724924273.9286048]
VI_after__Init : ['1.202', '0.3194', '1.800', '0.1516', '1.800', '0.0842', '7.000', '0.7079', 1, 1, 1, 1, 1724924281.9928436]
VI_at__the_End : ['1.202', '0.5092', '1.800', '0.1404', '1.804', '0.1110', '7.000', '0.7088', 1, 1, 1, 1, 1724924339.6503873]