TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_39_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-021-00 | FUSED_ID : 6359364768389693776
  IC_TEMP :  -48.53 | VDDM : 1122.73 | AUX_INT :   -9.24 | CsaBias :   73.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.33868e-03 / 2
  ADC_P0  : -9.23670e-03 ± 2.47720e-02
  ADC_P1  : 8.28961e-03 ± 5.95701e-04
  ADC_P2  : -5.82427e-06 ± 2.84987e-06
  CSA_Chi2/NDF : 1.43261e-04 / 2
  CSA_P0  : 5.98722e-02 ± 7.98337e-03
  CSA_P1  : 1.00705e-02 ± 6.01490e-04
  CSA_P2  : -4.70633e-05 ± 9.15998e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [33, 55, 56, 64, 85, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [20, 23, 25, 33, 50, 52, 115, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4553', '1.799', '0.1253', '1.799', '0.1004', '7.000', '0.7078', 1, 1, 1, 1, 1724924370.3968842]
VI_after__Init : ['1.201', '0.4557', '1.800', '0.1254', '1.800', '0.0950', '7.000', '0.7079', 1, 1, 1, 1, 1724924378.434363]
VI_at__the_End : ['1.202', '0.5055', '1.800', '0.1372', '1.800', '0.1116', '7.000', '0.7083', 1, 1, 1, 1, 1724924446.058062]