TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_41_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-022-00 | FUSED_ID : 6359364768389693792
  IC_TEMP :  -49.51 | VDDM : 1129.21 | AUX_INT :   -8.26 | CsaBias :   82.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08778e-03 / 2
  ADC_P0  : -8.26089e-03 ± 2.23209e-02
  ADC_P1  : 8.35780e-03 ± 5.45966e-04
  ADC_P2  : -5.75284e-06 ± 2.65252e-06
  CSA_Chi2/NDF : 1.42696e-04 / 2
  CSA_P0  : 6.10349e-02 ± 7.96762e-03
  CSA_P1  : 1.00389e-02 ± 6.00302e-04
  CSA_P2  : -4.67833e-05 ± 9.14190e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [3, 5, 56, 58, 67, 72, 91, 94, 100, 115, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [2, 84, 94, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1648', '1.800', '0.1295', '1.800', '0.0818', '7.000', '0.7078', 1, 1, 1, 1, 1724924466.1033127]
VI_after__Init : ['1.202', '0.1647', '1.800', '0.1295', '1.800', '0.0762', '7.000', '0.7079', 1, 1, 1, 1, 1724924474.0808423]
VI_at__the_End : ['1.201', '0.5021', '1.800', '0.1371', '1.800', '0.1110', '7.000', '0.7085', 1, 1, 1, 1, 1724924539.5726588]