TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_45_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-008-025-00 | FUSED_ID : 6359364768389693840
  IC_TEMP :  -52.50 | VDDM : 1127.98 | AUX_INT :   -8.79 | CsaBias :   81.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24581e-03 / 2
  ADC_P0  : -8.79068e-03 ± 2.39224e-02
  ADC_P1  : 8.22842e-03 ± 5.80225e-04
  ADC_P2  : -5.21903e-06 ± 2.80422e-06
  CSA_Chi2/NDF : 1.50526e-04 / 2
  CSA_P0  : 5.91421e-02 ± 8.18330e-03
  CSA_P1  : 1.01030e-02 ± 6.16552e-04
  CSA_P2  : -4.81780e-05 ± 9.38936e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [25, 63, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 16, 32, 43, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2366', '1.800', '0.1328', '1.800', '0.0853', '7.000', '0.7081', 1, 1, 1, 1, 1724924754.961923]
VI_after__Init : ['1.201', '0.2368', '1.800', '0.1326', '1.802', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1724924763.9382527]
VI_at__the_End : ['1.201', '0.4994', '1.800', '0.1359', '1.799', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1724924822.1897688]