TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_29_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-003-10 | FUSED_ID : 6359364768389697594
  IC_TEMP :  -54.96 | VDDM : 1125.09 | AUX_INT :   -8.96 | CsaBias :   83.23
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.26959e-04 / 2
  CSA_P0  : 6.03761e-02 ± 7.51544e-03
  CSA_P1  : 9.92641e-03 ± 5.66234e-04
  CSA_P2  : -4.58466e-05 ± 8.62308e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [27, 33, 42, 50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [28, 49, 89, 92, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3730', '1.800', '0.1257', '1.800', '0.0965', '7.000', '0.7088', 1, 1, 1, 1, 1724927345.214795]
VI_after__Init : ['1.201', '0.3731', '1.800', '0.1257', '1.800', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1724927353.3221586]
VI_at__the_End : ['1.202', '0.4978', '1.800', '0.1404', '1.800', '0.1127', '7.000', '0.7086', 1, 1, 1, 1, 1724927413.2886114]