TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_24_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-006-10 | FUSED_ID : 6359364768389697642
  IC_TEMP :  -52.67 | VDDM : 1110.79 | AUX_INT :   -8.78 | CsaBias :   83.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18625e-03 / 2
  ADC_P0  : -8.77966e-03 ± 2.32843e-02
  ADC_P1  : 8.42507e-03 ± 5.64655e-04
  ADC_P2  : -6.40845e-06 ± 2.71543e-06
  CSA_Chi2/NDF : 1.25951e-04 / 2
  CSA_P0  : 6.03395e-02 ± 7.48553e-03
  CSA_P1  : 9.84605e-03 ± 5.63981e-04
  CSA_P2  : -4.48457e-05 ± 8.58876e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 24, 28, 49, 50, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 4, 47, 51, 114, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3354', '1.800', '0.1233', '1.800', '0.0923', '7.000', '0.7078', 1, 1, 1, 1, 1724927057.0748086]
VI_after__Init : ['1.201', '0.3355', '1.800', '0.1233', '1.800', '0.0865', '7.000', '0.7076', 1, 1, 1, 1, 1724927065.278307]
VI_at__the_End : ['1.201', '0.4988', '1.800', '0.1402', '1.799', '0.1121', '7.000', '0.7084', 1, 1, 1, 1, 1724927124.2487056]