TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_11_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-014-10 | FUSED_ID : 6359364768389697770
  IC_TEMP :  -50.09 | VDDM : 1128.24 | AUX_INT :  -19.42 | CsaBias :   72.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93685e-03 / 2
  ADC_P0  : -1.94228e-02 ± 3.03762e-02
  ADC_P1  : 8.46414e-03 ± 7.29219e-04
  ADC_P2  : -6.29448e-06 ± 3.48821e-06
  CSA_Chi2/NDF : 8.62730e-05 / 2
  CSA_P0  : 6.02902e-02 ± 6.19526e-03
  CSA_P1  : 9.93655e-03 ± 4.66768e-04
  CSA_P2  : -4.58311e-05 ± 7.10833e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [6, 97, 115, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 29, 30, 57, 60, 62, 74, 77, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2138', '1.800', '0.1710', '1.800', '0.0840', '7.000', '0.7069', 1, 1, 1, 1, 1724926291.9941041]
VI_after__Init : ['1.202', '0.2136', '1.800', '0.1710', '1.800', '0.0782', '7.000', '0.7067', 1, 1, 1, 1, 1724926300.210395]
VI_at__the_End : ['1.201', '0.5011', '1.800', '0.1387', '1.800', '0.1098', '7.000', '0.7078', 1, 1, 1, 1, 1724926359.0328126]