TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_09_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-015-10 | FUSED_ID : 6359364768389697786
  IC_TEMP :  -53.54 | VDDM : 1139.35 | AUX_INT :   -4.43 | CsaBias :   77.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.99547e-04 / 2
  ADC_P0  : -4.42805e-03 ± 1.50933e-02
  ADC_P1  : 8.25125e-03 ± 3.71447e-04
  ADC_P2  : -5.62615e-06 ± 1.79419e-06
  CSA_Chi2/NDF : 9.71076e-05 / 2
  CSA_P0  : 5.86254e-02 ± 6.57278e-03
  CSA_P1  : 9.71511e-03 ± 4.95211e-04
  CSA_P2  : -4.41189e-05 ± 7.54148e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 14, 33, 66, 68, 83, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 35, 39, 42, 92, 99, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1125', '1.800', '0.1290', '1.800', '0.0846', '7.000', '0.7075', 1, 1, 1, 1, 1724926195.3454673]
VI_after__Init : ['1.201', '0.1125', '1.800', '0.1290', '1.800', '0.0774', '7.000', '0.7068', 1, 1, 1, 1, 1724926203.4298875]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1403', '1.800', '0.1116', '6.992', '0.7076', 1, 1, 1, 1, 1724926270.4487286]