TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_05_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-018-13 | FUSED_ID : 6359364768389697837
  IC_TEMP :  -53.08 | VDDM : 1135.81 | AUX_INT :   -7.17 | CsaBias :   74.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.00974e-04 / 2
  ADC_P0  : -7.17334e-03 ± 2.03511e-02
  ADC_P1  : 8.23757e-03 ± 5.04945e-04
  ADC_P2  : -4.72341e-06 ± 2.49037e-06
  CSA_Chi2/NDF : 1.18846e-04 / 2
  CSA_P0  : 6.01753e-02 ± 7.27133e-03
  CSA_P1  : 9.92448e-03 ± 5.47843e-04
  CSA_P2  : -4.64278e-05 ± 8.34299e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [22, 36, 54, 68, 90, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 13, 28, 55, 103, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3173', '1.800', '0.1177', '1.800', '0.0901', '7.000', '0.7076', 1, 1, 1, 1, 1724925907.9483542]
VI_after__Init : ['1.201', '0.3176', '1.800', '0.1177', '1.800', '0.0828', '7.000', '0.7067', 1, 1, 1, 1, 1724925916.2267215]
VI_at__the_End : ['1.201', '0.4997', '1.800', '0.1393', '1.803', '0.1114', '7.000', '0.7075', 1, 1, 1, 1, 1724925975.1912866]