TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_01_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-020-13 | FUSED_ID : 6359364768389697869
  IC_TEMP :  -54.64 | VDDM : 1126.27 | AUX_INT :   -6.31 | CsaBias :   67.48
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01512e-03 / 2
  ADC_P0  : -6.31498e-03 ± 2.15981e-02
  ADC_P1  : 8.24660e-03 ± 5.33407e-04
  ADC_P2  : -5.23289e-06 ± 2.59849e-06
  CSA_Chi2/NDF : 1.40005e-04 / 2
  CSA_P0  : 5.92886e-02 ± 7.89212e-03
  CSA_P1  : 1.02499e-02 ± 5.94615e-04
  CSA_P2  : -5.13138e-05 ± 9.05528e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 24, 47, 51, 53, 59, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [9, 31, 78, 104, 115, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3525', '1.800', '0.1779', '1.800', '0.0915', '7.000', '0.7070', 1, 1, 1, 1, 1724925715.7210362]
VI_after__Init : ['1.202', '0.3526', '1.800', '0.1779', '1.800', '0.0857', '7.000', '0.7069', 1, 1, 1, 1, 1724925723.757473]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1412', '1.800', '0.1116', '7.000', '0.7075', 1, 1, 1, 1, 1724925782.7139668]