TEST_NAME : Wafer
TEST_DATE : 24_08_29-11_53_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-009-025-13 | FUSED_ID : 6359364768389697949
  IC_TEMP :  -51.25 | VDDM : 1131.63 | AUX_INT :   -7.01 | CsaBias :   73.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01308e-03 / 2
  ADC_P0  : -7.00798e-03 ± 2.15528e-02
  ADC_P1  : 8.14916e-03 ± 5.18766e-04
  ADC_P2  : -5.44985e-06 ± 2.46612e-06
  CSA_Chi2/NDF : 1.25039e-04 / 2
  CSA_P0  : 5.69284e-02 ± 7.45838e-03
  CSA_P1  : 9.76569e-03 ± 5.61935e-04
  CSA_P2  : -4.30937e-05 ± 8.55761e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [10, 19, 55, 78, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [7, 15, 25, 70, 74, 80, 83, 91, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4089', '1.800', '0.1635', '1.800', '0.0931', '7.000', '0.7075', 1, 1, 1, 1, 1724925234.9339466]
VI_after__Init : ['1.201', '0.4089', '1.800', '0.1636', '1.800', '0.0877', '7.000', '0.7076', 1, 1, 1, 1, 1724925243.6752317]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1360', '1.800', '0.1103', '7.000', '0.7081', 1, 1, 1, 1, 1724925310.6661453]