TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_33_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-003-04 | FUSED_ID : 6359364768389701684
  IC_TEMP :  -52.65 | VDDM : 1128.45 | AUX_INT :   -9.25 | CsaBias :   74.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24351e-03 / 2
  ADC_P0  : -9.25168e-03 ± 2.38215e-02
  ADC_P1  : 8.45885e-03 ± 5.74584e-04
  ADC_P2  : -6.68544e-06 ± 2.75031e-06
  CSA_Chi2/NDF : 1.21330e-04 / 2
  CSA_P0  : 5.90429e-02 ± 7.34695e-03
  CSA_P1  : 9.88167e-03 ± 5.53540e-04
  CSA_P2  : -4.49491e-05 ± 8.42976e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 25, 30, 55, 75, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 7, 17, 43, 87, 102, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2605', '1.800', '0.1218', '1.800', '0.0894', '7.000', '0.7089', 1, 1, 1, 1, 1724927633.6995876]
VI_after__Init : ['1.201', '0.2606', '1.800', '0.1219', '1.800', '0.0819', '7.000', '0.7079', 1, 1, 1, 1, 1724927641.7930105]
VI_at__the_End : ['1.201', '0.4995', '1.800', '0.1408', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1724927703.4492643]