TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_43_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-009-04 | FUSED_ID : 6359364768389701780
  IC_TEMP :  -55.90 | VDDM : 1120.76 | AUX_INT :   -9.70 | CsaBias :   66.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43431e-03 / 2
  ADC_P0  : -9.70466e-03 ± 2.56308e-02
  ADC_P1  : 8.48553e-03 ± 6.25652e-04
  ADC_P2  : -6.32720e-06 ± 3.03935e-06
  CSA_Chi2/NDF : 1.36669e-04 / 2
  CSA_P0  : 6.07164e-02 ± 7.79753e-03
  CSA_P1  : 1.03658e-02 ± 5.87487e-04
  CSA_P2  : -5.30184e-05 ± 8.94674e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [13, 18, 86, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 45, 77, 85, 92, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1887', '1.800', '0.1748', '1.800', '0.0886', '7.000', '0.7075', 1, 1, 1, 1, 1724928209.4394693]
VI_after__Init : ['1.201', '0.1888', '1.800', '0.1749', '1.800', '0.0829', '7.000', '0.7077', 1, 1, 1, 1, 1724928218.225773]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1405', '1.800', '0.1142', '7.000', '0.7082', 1, 1, 1, 1, 1724928280.2400787]