TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_45_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-010-04 | FUSED_ID : 6359364768389701796
  IC_TEMP :  -64.79 | VDDM : 1205.86 | AUX_INT : -790.36 | CsaBias : -573.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.26703e-02 / 2
  ADC_P0  : -7.90364e-01 ± 2.82818e-01
  ADC_P1  : 2.02163e-02 ± 5.51736e-03
  ADC_P2  : -4.71029e-05 ± 2.19974e-05
  CSA_Chi2/NDF : 1.18654e-04 / 2
  CSA_P0  : 5.99255e-02 ± 7.26548e-03
  CSA_P1  : 9.81481e-03 ± 5.47401e-04
  CSA_P2  : -4.53837e-05 ± 8.33628e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [25, 41, 106, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [17, 49, 59, 65, 93, 104, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4414', '1.800', '0.1260', '1.800', '0.0873', '7.000', '0.7075', 1, 1, 1, 1, 1724928306.5819547]
VI_after__Init : ['1.201', '0.4415', '1.800', '0.1260', '1.800', '0.0817', '7.000', '0.7076', 1, 1, 1, 1, 1724928314.640424]
VI_at__the_End : ['1.201', '0.4956', '1.800', '0.1380', '1.801', '0.1107', '7.000', '0.7083', 1, 1, 1, 1, 1724928374.820713]