TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_48_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-012-04 | FUSED_ID : 6359364768389701828
  IC_TEMP :  -52.70 | VDDM : 1132.95 | AUX_INT :   -7.66 | CsaBias :   58.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.26130e-04 / 2
  ADC_P0  : -7.65871e-03 ± 2.05515e-02
  ADC_P1  : 8.34528e-03 ± 4.95149e-04
  ADC_P2  : -6.36459e-06 ± 2.35747e-06
  CSA_Chi2/NDF : 9.46076e-05 / 2
  CSA_P0  : 6.16392e-02 ± 6.48762e-03
  CSA_P1  : 9.91757e-03 ± 4.88795e-04
  CSA_P2  : -4.67615e-05 ± 7.44377e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [9, 20, 49, 60, 84, 103, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 53, 66, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1834', '1.800', '0.1499', '1.800', '0.0794', '7.000', '0.7072', 1, 1, 1, 1, 1724928499.1808295]
VI_after__Init : ['1.201', '0.1834', '1.800', '0.1498', '1.800', '0.0738', '7.000', '0.7071', 1, 1, 1, 1, 1724928507.184118]
VI_at__the_End : ['1.201', '0.4974', '1.800', '0.1385', '1.800', '0.1113', '7.000', '0.7080', 1, 1, 1, 1, 1724928572.366922]