TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_51_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-014-04 | FUSED_ID : 6359364768389701860
  IC_TEMP :  -50.57 | VDDM : 1119.74 | AUX_INT :   -6.44 | CsaBias :   71.66
  CONF_FAIL_REG : 16
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.42629e-04 / 2
  ADC_P0  : -6.44307e-03 ± 1.84054e-02
  ADC_P1  : 8.73785e-03 ± 4.70425e-04
  ADC_P2  : -6.69681e-06 ± 2.36935e-06
  CSA_Chi2/NDF : 1.17733e-04 / 2
  CSA_P0  : 6.12967e-02 ± 7.23720e-03
  CSA_P1  : 1.01501e-02 ± 5.45271e-04
  CSA_P2  : -4.90863e-05 ± 8.30383e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 24, 57, 75, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [9, 25, 29, 35, 44, 53, 95, 97, 108, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3536', '1.800', '0.1565', '1.800', '0.0920', '7.000', '0.7078', 1, 1, 1, 1, 1724928691.9135091]
VI_after__Init : ['1.201', '0.3536', '1.800', '0.1565', '1.800', '0.0845', '7.000', '0.7072', 1, 1, 1, 1, 1724928700.025842]
VI_at__the_End : ['1.201', '0.5042', '1.800', '0.1407', '1.800', '0.1097', '7.000', '0.7078', 1, 1, 1, 1, 1724928764.0837855]