TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_53_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-015-04 | FUSED_ID : 6359364768389701876
  IC_TEMP :  -49.18 | VDDM : 1134.79 | AUX_INT :   -6.97 | CsaBias :   85.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.94941e-04 / 2
  ADC_P0  : -6.97114e-03 ± 2.02242e-02
  ADC_P1  : 8.45457e-03 ± 5.00038e-04
  ADC_P2  : -6.20391e-06 ± 2.44007e-06
  CSA_Chi2/NDF : 7.49692e-05 / 2
  CSA_P0  : 5.98952e-02 ± 5.77516e-03
  CSA_P1  : 9.57053e-03 ± 4.35116e-04
  CSA_P2  : -4.17437e-05 ± 6.62631e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [25, 45, 81, 101, 107, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 28, 58, 69, 114, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3005', '1.800', '0.1381', '1.800', '0.0903', '7.000', '0.7075', 1, 1, 1, 1, 1724928787.453003]
VI_after__Init : ['1.201', '0.3004', '1.800', '0.1381', '1.800', '0.0846', '7.000', '0.7072', 1, 1, 1, 1, 1724928796.313251]
VI_at__the_End : ['1.201', '0.4925', '1.800', '0.1373', '1.800', '0.1103', '7.000', '0.7077', 1, 1, 1, 1, 1724928854.7847004]