TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_54_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-016-03 | FUSED_ID : 6359364768389701891
  IC_TEMP :  -52.11 | VDDM : 1126.56 | AUX_INT :   -9.48 | CsaBias :   59.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39727e-03 / 2
  ADC_P0  : -9.48095e-03 ± 2.53062e-02
  ADC_P1  : 8.62700e-03 ± 6.30671e-04
  ADC_P2  : -6.42611e-06 ± 3.12678e-06
  CSA_Chi2/NDF : 1.41331e-04 / 2
  CSA_P0  : 6.22036e-02 ± 7.92941e-03
  CSA_P1  : 1.06532e-02 ± 5.97424e-04
  CSA_P2  : -5.50618e-05 ± 9.09806e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 76, 102, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 44, 64, 67, 82, 99, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2612', '1.800', '0.1652', '1.800', '0.0850', '7.000', '0.7069', 1, 1, 1, 1, 1724928884.1833584]
VI_after__Init : ['1.201', '0.2614', '1.800', '0.1652', '1.800', '0.0806', '7.000', '0.7072', 1, 1, 1, 1, 1724928892.1887417]
VI_at__the_End : ['1.201', '0.5106', '1.800', '0.1424', '1.800', '0.1111', '7.000', '0.7075', 1, 1, 1, 1, 1724928951.9490266]