TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_56_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-017-03 | FUSED_ID : 6359364768389701907
  IC_TEMP :  -53.17 | VDDM : 1117.51 | AUX_INT :   -5.89 | CsaBias :   70.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.39994e-04 / 2
  ADC_P0  : -5.88865e-03 ± 1.83758e-02
  ADC_P1  : 8.54815e-03 ± 4.60821e-04
  ADC_P2  : -6.47021e-06 ± 2.27136e-06
  CSA_Chi2/NDF : 9.42533e-05 / 2
  CSA_P0  : 5.90915e-02 ± 6.47546e-03
  CSA_P1  : 1.00371e-02 ± 4.87879e-04
  CSA_P2  : -4.68106e-05 ± 7.42982e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 29, 45, 63, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [32, 60, 68]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3741', '1.800', '0.1843', '1.800', '0.0917', '7.000', '0.7076', 1, 1, 1, 1, 1724928980.4508023]
VI_after__Init : ['1.201', '0.3742', '1.800', '0.1843', '1.800', '0.0846', '7.000', '0.7068', 1, 1, 1, 1, 1724928989.2831638]
VI_at__the_End : ['1.201', '0.5022', '1.800', '0.1412', '1.799', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1724929052.5461385]