TEST_NAME : Wafer
TEST_DATE : 24_08_29-12_59_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x5 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-019-03 | FUSED_ID : 6359364768389701939
  IC_TEMP :  -54.84 | VDDM : 1126.14 | AUX_INT :   -8.25 | CsaBias :   59.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30088e-03 / 2
  ADC_P0  : -8.25387e-03 ± 2.44476e-02
  ADC_P1  : 8.55435e-03 ± 6.14021e-04
  ADC_P2  : -6.01049e-06 ± 3.05603e-06
  CSA_Chi2/NDF : 1.50595e-04 / 2
  CSA_P0  : 5.98843e-02 ± 8.18518e-03
  CSA_P1  : 1.04614e-02 ± 6.16694e-04
  CSA_P2  : -5.29168e-05 ± 9.39152e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [7, 20, 31, 37, 57, 59, 72, 105, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [1, 9, 36, 40, 96, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3164', '1.800', '0.1230', '1.800', '0.0849', '7.000', '0.7068', 1, 1, 1, 1, 1724929171.4759843]
VI_after__Init : ['1.201', '0.3165', '1.800', '0.1231', '1.800', '0.0792', '7.000', '0.7066', 1, 1, 1, 1, 1724929180.3763313]
VI_at__the_End : ['1.201', '0.5046', '1.800', '0.1420', '1.799', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1724929243.3514318]