TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_04_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-022-03 | FUSED_ID : 6359364768389701987
  IC_TEMP :  -55.31 | VDDM : 1120.71 | AUX_INT :   -9.61 | CsaBias :   74.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53145e-03 / 2
  ADC_P0  : -9.60737e-03 ± 2.65528e-02
  ADC_P1  : 8.45767e-03 ± 6.59682e-04
  ADC_P2  : -5.54331e-06 ± 3.26879e-06
  CSA_Chi2/NDF : 1.33337e-04 / 2
  CSA_P0  : 6.00654e-02 ± 7.70191e-03
  CSA_P1  : 1.03575e-02 ± 5.80283e-04
  CSA_P2  : -5.38679e-05 ± 8.83703e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 7, 24, 36, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [8, 39, 61, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2659', '1.800', '0.1209', '1.800', '0.0875', '7.000', '0.7081', 1, 1, 1, 1, 1724929461.4605303]
VI_after__Init : ['1.201', '0.2654', '1.800', '0.1208', '1.801', '0.0801', '7.000', '0.7070', 1, 1, 1, 1, 1724929469.5449505]
VI_at__the_End : ['1.201', '0.4914', '1.800', '0.1373', '1.800', '0.1128', '7.000', '0.7077', 1, 1, 1, 1, 1724929532.9899502]