TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_05_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-010-023-03 | FUSED_ID : 6359364768389702003
  IC_TEMP :  -54.50 | VDDM : 1131.47 | AUX_INT : -109.47 | CsaBias :   -8.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.75538e-04 / 2
  ADC_P0  : -1.09465e-01 ± 2.55475e-02
  ADC_P1  : 1.02340e-02 ± 6.17708e-04
  ADC_P2  : -1.21926e-05 ± 2.93619e-06
  CSA_Chi2/NDF : 1.32498e-04 / 2
  CSA_P0  : 6.11018e-02 ± 7.67764e-03
  CSA_P1  : 1.00357e-02 ± 5.78455e-04
  CSA_P2  : -4.79657e-05 ± 8.80918e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 50, 113, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [2, 8, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1902', '1.800', '0.1220', '1.800', '0.0837', '7.000', '0.7069', 1, 1, 1, 1, 1724929557.326027]
VI_after__Init : ['1.202', '0.1901', '1.800', '0.1220', '1.800', '0.0784', '7.000', '0.7068', 1, 1, 1, 1, 1724929565.3954208]
VI_at__the_End : ['1.201', '0.5003', '1.800', '0.1407', '1.802', '0.1131', '7.000', '0.7079', 1, 1, 1, 1, 1724929627.374634]