TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_50_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-004-09 | FUSED_ID : 6359364768389705801
  IC_TEMP :  -50.37 | VDDM : 1126.48 | AUX_INT :   -8.19 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40509e-03 / 2
  ADC_P0  : -8.18649e-03 ± 2.54641e-02
  ADC_P1  : 8.36784e-03 ± 6.37482e-04
  ADC_P2  : -5.05123e-06 ± 3.17071e-06
  CSA_Chi2/NDF : 1.43445e-04 / 2
  CSA_P0  : 6.25369e-02 ± 7.98849e-03
  CSA_P1  : 1.01655e-02 ± 6.01875e-04
  CSA_P2  : -4.89871e-05 ± 9.16585e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [20, 58, 60, 84, 98, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [4, 13, 26, 27, 50, 86, 101, 110, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2879', '1.800', '0.1576', '1.800', '0.0873', '7.000', '0.7068', 1, 1, 1, 1, 1724932230.2252252]
VI_after__Init : ['1.201', '0.2880', '1.800', '0.1575', '1.800', '0.0817', '7.000', '0.7066', 1, 1, 1, 1, 1724932238.3096824]
VI_at__the_End : ['1.201', '0.5043', '1.800', '0.1393', '1.800', '0.1119', '7.000', '0.7075', 1, 1, 1, 1, 1724932304.2726066]