TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_48_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-005-09 | FUSED_ID : 6359364768389705817
  IC_TEMP :  -56.35 | VDDM : 1127.06 | AUX_INT :  -34.48 | CsaBias :   45.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04728e-03 / 2
  ADC_P0  : -3.44791e-02 ± 2.31126e-02
  ADC_P1  : 8.93455e-03 ± 5.71601e-04
  ADC_P2  : -7.64413e-06 ± 2.78169e-06
  CSA_Chi2/NDF : 1.52125e-04 / 2
  CSA_P0  : 5.84952e-02 ± 8.22665e-03
  CSA_P1  : 9.90286e-03 ± 6.19819e-04
  CSA_P2  : -4.75746e-05 ± 9.43911e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [23, 54, 67, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [8, 39, 43, 49, 89, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2096', '1.800', '0.1397', '1.800', '0.0845', '7.000', '0.7076', 1, 1, 1, 1, 1724932133.7786503]
VI_after__Init : ['1.201', '0.2096', '1.800', '0.1396', '1.800', '0.0775', '7.000', '0.7067', 1, 1, 1, 1, 1724932141.7980003]
VI_at__the_End : ['1.201', '0.4910', '1.800', '0.1398', '1.800', '0.1122', '7.000', '0.7076', 1, 1, 1, 1, 1724932201.4444315]