TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_44_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-008-09 | FUSED_ID : 6359364768389705865
  IC_TEMP :  -52.32 | VDDM : 1126.97 | AUX_INT :   -8.63 | CsaBias :   74.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22196e-03 / 2
  ADC_P0  : -8.63440e-03 ± 2.37007e-02
  ADC_P1  : 8.36734e-03 ± 5.86804e-04
  ADC_P2  : -5.31074e-06 ± 2.89402e-06
  CSA_Chi2/NDF : 1.73191e-04 / 2
  CSA_P0  : 6.16474e-02 ± 8.77778e-03
  CSA_P1  : 1.06039e-02 ± 6.61343e-04
  CSA_P2  : -5.49402e-05 ± 1.00715e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [14, 25, 45, 63, 75, 89, 99, 106, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2294', '1.800', '0.1693', '1.800', '0.0940', '7.000', '0.7076', 1, 1, 1, 1, 1724931845.1985877]
VI_after__Init : ['1.202', '0.2292', '1.800', '0.1694', '1.801', '0.0865', '7.000', '0.7070', 1, 1, 1, 1, 1724931853.9989235]
VI_at__the_End : ['1.201', '0.5061', '1.800', '0.1406', '1.801', '0.1128', '7.000', '0.7075', 1, 1, 1, 1, 1724931920.3427658]