TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_36_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-013-09 | FUSED_ID : 6359364768389705945
  IC_TEMP :  -41.33 | VDDM : 1119.89 | AUX_INT :   -6.48 | CsaBias :   75.11
  CONF_FAIL_REG : 70
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.71573e-04 / 2
  ADC_P0  : -6.48116e-03 ± 2.00251e-02
  ADC_P1  : 8.20517e-03 ± 4.97893e-04
  ADC_P2  : -4.64029e-06 ± 2.45310e-06
  CSA_Chi2/NDF : 1.05514e-04 / 2
  CSA_P0  : 5.83527e-02 ± 6.85136e-03
  CSA_P1  : 1.00437e-02 ± 5.16201e-04
  CSA_P2  : -4.76638e-05 ± 7.86112e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [55, 78, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [15, 22, 44, 88, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1761', '1.800', '0.1728', '1.800', '0.0889', '7.000', '0.7071', 1, 1, 1, 1, 1724931365.6788538]
VI_after__Init : ['1.201', '0.1762', '1.800', '0.1728', '1.800', '0.0835', '7.000', '0.7073', 1, 1, 1, 1, 1724931373.7612798]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1620', '1.803', '0.1139', '7.000', '0.7079', 1, 1, 1, 1, 1724931433.4497976]