TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_34_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-014-09 | FUSED_ID : 6359364768389705961
  IC_TEMP :  -56.67 | VDDM : 1126.29 | AUX_INT :   -7.39 | CsaBias :   61.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.73159e-04 / 2
  CSA_P0  : 6.13828e-02 ± 8.77698e-03
  CSA_P1  : 1.06014e-02 ± 6.61282e-04
  CSA_P2  : -5.61424e-05 ± 1.00705e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 21, 37, 71, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [4, 10, 15, 38, 42, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3593', '1.800', '0.1673', '1.800', '0.0957', '7.000', '0.7074', 1, 1, 1, 1, 1724931269.4593298]
VI_after__Init : ['1.201', '0.3594', '1.800', '0.1672', '1.800', '0.0900', '7.000', '0.7072', 1, 1, 1, 1, 1724931277.6865823]
VI_at__the_End : ['1.201', '0.5025', '1.800', '0.1410', '1.799', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1724931346.0863676]