TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_32_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-015-09 | FUSED_ID : 6359364768389705977
  IC_TEMP :  -48.14 | VDDM : 1134.57 | AUX_INT :   -6.95 | CsaBias :   83.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.54764e-04 / 2
  ADC_P0  : -6.95133e-03 ± 2.09368e-02
  ADC_P1  : 8.27082e-03 ± 5.16009e-04
  ADC_P2  : -5.29361e-06 ± 2.51632e-06
  CSA_Chi2/NDF : 1.04017e-04 / 2
  CSA_P0  : 5.98101e-02 ± 6.80259e-03
  CSA_P1  : 9.80365e-03 ± 5.12526e-04
  CSA_P2  : -4.43574e-05 ± 7.80516e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [11, 90, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [15, 24, 46, 55, 94, 111, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3608', '1.800', '0.1238', '1.800', '0.0906', '7.000', '0.7073', 1, 1, 1, 1, 1724931173.6843855]
VI_after__Init : ['1.201', '0.3607', '1.800', '0.1238', '1.800', '0.0849', '7.000', '0.7074', 1, 1, 1, 1, 1724931181.7418394]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1405', '1.800', '0.1111', '7.000', '0.7079', 1, 1, 1, 1, 1724931241.7732704]