TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_31_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-016-14 | FUSED_ID : 6359364768389705998
  IC_TEMP :  -56.23 | VDDM : 1134.79 | AUX_INT :   -7.21 | CsaBias :   67.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.97735e-04 / 2
  ADC_P0  : -7.20910e-03 ± 2.02494e-02
  ADC_P1  : 8.31305e-03 ± 4.90481e-04
  ADC_P2  : -6.09891e-06 ± 2.34599e-06
  CSA_Chi2/NDF : 1.16115e-04 / 2
  CSA_P0  : 6.00624e-02 ± 7.18730e-03
  CSA_P1  : 9.86479e-03 ± 5.41511e-04
  CSA_P2  : -4.78769e-05 ± 8.24658e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [40, 47, 94, 118, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [43, 62, 64, 79, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3641', '1.800', '0.1551', '1.800', '0.0996', '7.000', '0.7083', 1, 1, 1, 1, 1724931077.620603]
VI_after__Init : ['1.201', '0.3641', '1.800', '0.1551', '1.800', '0.0925', '7.000', '0.7074', 1, 1, 1, 1, 1724931085.7461264]
VI_at__the_End : ['1.201', '0.4895', '1.800', '0.1385', '1.800', '0.1107', '7.000', '0.7079', 1, 1, 1, 1, 1724931153.462969]