TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_26_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-019-14 | FUSED_ID : 6359364768389706046
  IC_TEMP :  -53.21 | VDDM : 1119.39 | AUX_INT :   -8.56 | CsaBias :   86.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14705e-03 / 2
  ADC_P0  : -8.56351e-03 ± 2.29186e-02
  ADC_P1  : 8.70917e-03 ± 5.81318e-04
  ADC_P2  : -6.41499e-06 ± 2.92855e-06
  CSA_Chi2/NDF : 9.36793e-05 / 2
  CSA_P0  : 6.07602e-02 ± 6.45571e-03
  CSA_P1  : 9.86783e-03 ± 4.86391e-04
  CSA_P2  : -4.38218e-05 ± 7.40716e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 52, 83, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [14, 24, 29, 34, 50, 69, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3248', '1.800', '0.1905', '1.800', '0.0840', '7.000', '0.7077', 1, 1, 1, 1, 1724930788.6723094]
VI_after__Init : ['1.201', '0.3250', '1.800', '0.1905', '1.800', '0.0783', '7.000', '0.7079', 1, 1, 1, 1, 1724930796.7417328]
VI_at__the_End : ['1.201', '0.5050', '1.800', '0.1423', '1.800', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1724930863.9076934]