TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_24_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-020-14 | FUSED_ID : 6359364768389706062
  IC_TEMP :  -53.62 | VDDM : 1130.35 | AUX_INT :   -7.67 | CsaBias :   67.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24359e-03 / 2
  ADC_P0  : -7.67315e-03 ± 2.39055e-02
  ADC_P1  : 8.36468e-03 ± 5.89268e-04
  ADC_P2  : -5.77414e-06 ± 2.87079e-06
  CSA_Chi2/NDF : 1.31380e-04 / 2
  CSA_P0  : 6.13927e-02 ± 7.64517e-03
  CSA_P1  : 9.88845e-03 ± 5.76009e-04
  CSA_P2  : -4.61972e-05 ± 8.77193e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [46, 92, 105, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 34, 68, 109, 115, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2556', '1.800', '0.1480', '1.800', '0.0930', '7.000', '0.7085', 1, 1, 1, 1, 1724930692.9714432]
VI_after__Init : ['1.201', '0.2556', '1.800', '0.1480', '1.800', '0.0854', '7.000', '0.7076', 1, 1, 1, 1, 1724930701.90186]
VI_at__the_End : ['1.201', '0.4986', '1.800', '0.1399', '1.799', '0.1140', '7.000', '0.7087', 1, 1, 1, 1, 1724930766.427963]