TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_21_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-022-14 | FUSED_ID : 6359364768389706094
  IC_TEMP :  -52.47 | VDDM : 1128.01 | AUX_INT :   -7.10 | CsaBias :   83.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.64864e-04 / 2
  ADC_P0  : -7.09898e-03 ± 1.98753e-02
  ADC_P1  : 8.30020e-03 ± 4.81418e-04
  ADC_P2  : -6.03492e-06 ± 2.30264e-06
  CSA_Chi2/NDF : 1.18739e-04 / 2
  CSA_P0  : 5.84416e-02 ± 7.26806e-03
  CSA_P1  : 9.99524e-03 ± 5.47596e-04
  CSA_P2  : -4.71668e-05 ± 8.33924e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [11, 27, 35, 48, 54, 60, 75, 99, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [20, 25, 26, 54, 60, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3499', '1.800', '0.1612', '1.800', '0.0916', '7.000', '0.7076', 1, 1, 1, 1, 1724930500.4777339]
VI_after__Init : ['1.201', '0.3500', '1.800', '0.1612', '1.800', '0.0859', '7.000', '0.7079', 1, 1, 1, 1, 1724930509.2110312]
VI_at__the_End : ['1.201', '0.4971', '1.800', '0.1357', '1.799', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1724930577.37907]