TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_18_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-024-14 | FUSED_ID : 6359364768389706126
  IC_TEMP :  -51.36 | VDDM : 1121.59 | AUX_INT :   -9.48 | CsaBias :   78.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80645e-03 / 2
  ADC_P0  : -9.47599e-03 ± 2.89019e-02
  ADC_P1  : 8.03349e-03 ± 6.88760e-04
  ADC_P2  : -4.75024e-06 ± 3.27027e-06
  CSA_Chi2/NDF : 1.07724e-04 / 2
  CSA_P0  : 5.70612e-02 ± 6.92274e-03
  CSA_P1  : 9.74974e-03 ± 5.21578e-04
  CSA_P2  : -4.43551e-05 ± 7.94302e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [43, 86, 99, 104, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [8, 22, 26, 36, 39, 91, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4491', '1.800', '0.1326', '1.800', '0.0937', '7.000', '0.7085', 1, 1, 1, 1, 1724930308.6250675]
VI_after__Init : ['1.201', '0.4495', '1.800', '0.1328', '1.800', '0.0864', '7.000', '0.7076', 1, 1, 1, 1, 1724930316.7174232]
VI_at__the_End : ['1.201', '0.4892', '1.800', '0.1346', '1.800', '0.1121', '7.000', '0.7082', 1, 1, 1, 1, 1724930376.9198124]