TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_16_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-011-025-14 | FUSED_ID : 6359364768389706142
  IC_TEMP :  -49.01 | VDDM : 1130.59 | AUX_INT :   -8.53 | CsaBias :   73.76
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.47959e-03 / 2
  ADC_P0  : -8.53286e-03 ± 2.60855e-02
  ADC_P1  : 8.28753e-03 ± 6.32138e-04
  ADC_P2  : -5.78342e-06 ± 3.03257e-06
  CSA_Chi2/NDF : 7.10701e-05 / 2
  CSA_P0  : 5.89697e-02 ± 5.62297e-03
  CSA_P1  : 9.31742e-03 ± 4.23650e-04
  CSA_P2  : -3.61073e-05 ± 6.45169e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [4, 8, 20, 30, 80, 88, 92, 101, 114, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1126', '1.800', '0.0705', '1.800', '0.0856', '7.000', '0.7085', 1, 1, 1, 1, 1724930212.9814725]
VI_after__Init : ['1.201', '0.1126', '1.800', '0.0705', '1.800', '0.0782', '7.000', '0.7076', 1, 1, 1, 1, 1724930221.119818]
VI_at__the_End : ['1.201', '0.4998', '1.800', '0.1345', '1.799', '0.1099', '7.000', '0.7083', 1, 1, 1, 1, 1724930282.2590768]