TEST_NAME : Wafer
TEST_DATE : 24_08_29-13_56_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-003-01 | FUSED_ID : 6359364768389709873
  IC_TEMP :  -52.65 | VDDM : 1128.99 | AUX_INT :   -7.27 | CsaBias :   81.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.86428e-04 / 2
  ADC_P0  : -7.26633e-03 ± 2.01155e-02
  ADC_P1  : 8.16214e-03 ± 4.77522e-04
  ADC_P2  : -5.89057e-06 ± 2.23960e-06
  CSA_Chi2/NDF : 1.28229e-04 / 2
  CSA_P0  : 5.86491e-02 ± 7.55294e-03
  CSA_P1  : 9.85689e-03 ± 5.69060e-04
  CSA_P2  : -4.30942e-05 ± 8.66611e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [1, 18, 60, 65, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 17, 52, 99, 102, 107, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4591', '1.800', '0.1738', '1.800', '0.1015', '7.000', '0.7072', 1, 1, 1, 1, 1724932614.5790184]
VI_after__Init : ['1.201', '0.4593', '1.800', '0.1738', '1.799', '0.0961', '7.000', '0.7070', 1, 1, 1, 1, 1724932623.355347]
VI_at__the_End : ['1.201', '0.5046', '1.800', '0.1405', '1.804', '0.1108', '7.000', '0.7079', 1, 1, 1, 1, 1724932689.1022966]