TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_00_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-005-01 | FUSED_ID : 6359364768389709905
  IC_TEMP :  -49.73 | VDDM : 1129.34 | AUX_INT :   -7.28 | CsaBias :   82.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33611e-04 / 2
  ADC_P0  : -7.28481e-03 ± 2.07164e-02
  ADC_P1  : 8.25073e-03 ± 5.14009e-04
  ADC_P2  : -4.79079e-06 ± 2.53508e-06
  CSA_Chi2/NDF : 1.62053e-04 / 2
  CSA_P0  : 6.11024e-02 ± 8.49085e-03
  CSA_P1  : 1.04218e-02 ± 6.39724e-04
  CSA_P2  : -5.12480e-05 ± 9.74224e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [61, 62, 66]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [80, 100, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3036', '1.800', '0.1527', '1.800', '0.0948', '7.000', '0.7079', 1, 1, 1, 1, 1724932807.8662739]
VI_after__Init : ['1.201', '0.3035', '1.800', '0.1525', '1.800', '0.0873', '7.000', '0.7072', 1, 1, 1, 1, 1724932816.0506434]
VI_at__the_End : ['1.201', '0.5112', '1.800', '0.1416', '1.803', '0.1101', '7.000', '0.7081', 1, 1, 1, 1, 1724932882.9695325]