TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_01_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-006-01 | FUSED_ID : 6359364768389709921
  IC_TEMP :  -52.79 | VDDM : 1131.17 | AUX_INT :   -5.83 | CsaBias :   73.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.26499e-04 / 2
  ADC_P0  : -5.83161e-03 ± 1.82570e-02
  ADC_P1  : 8.01856e-03 ± 4.41733e-04
  ADC_P2  : -4.67994e-06 ± 2.11141e-06
  CSA_Chi2/NDF : 1.15391e-04 / 2
  CSA_P0  : 6.24016e-02 ± 7.16486e-03
  CSA_P1  : 1.00247e-02 ± 5.39820e-04
  CSA_P2  : -4.62519e-05 ± 8.22082e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [14, 19, 80, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [16, 55, 56, 57, 77, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3708', '1.800', '0.1506', '1.800', '0.0954', '7.000', '0.7072', 1, 1, 1, 1, 1724932903.7739697]
VI_after__Init : ['1.201', '0.3711', '1.800', '0.1506', '1.799', '0.0898', '7.000', '0.7074', 1, 1, 1, 1, 1724932911.8583279]
VI_at__the_End : ['1.201', '0.5066', '1.800', '0.1416', '1.800', '0.1113', '7.000', '0.7080', 1, 1, 1, 1, 1724932971.2687783]