TEST_NAME : Wafer
TEST_DATE : 24_08_29-14_03_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-016-012-007-01 | FUSED_ID : 6359364768389709937
  IC_TEMP :  -48.37 | VDDM : 1128.51 | AUX_INT :   -6.98 | CsaBias :   83.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.85288e-04 / 2
  ADC_P0  : -6.97606e-03 ± 2.12688e-02
  ADC_P1  : 8.27656e-03 ± 5.24193e-04
  ADC_P2  : -5.30418e-06 ± 2.55622e-06
  CSA_Chi2/NDF : 9.97676e-05 / 2
  CSA_P0  : 6.08842e-02 ± 6.66219e-03
  CSA_P1  : 9.76630e-03 ± 5.01948e-04
  CSA_P2  : -4.28257e-05 ± 7.64408e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [11, 20, 32, 56, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [18, 21, 37, 43, 51, 93, 100, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1558', '1.800', '0.1443', '1.800', '0.0821', '7.000', '0.7073', 1, 1, 1, 1, 1724932999.767679]
VI_after__Init : ['1.201', '0.1558', '1.800', '0.1442', '1.800', '0.0771', '7.000', '0.7075', 1, 1, 1, 1, 1724933007.7980354]
VI_at__the_End : ['1.201', '0.5027', '1.800', '0.1426', '1.800', '0.1111', '7.000', '0.7082', 1, 1, 1, 1, 1724933068.3813572]